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Mohd Fazil, Azlan Faizal and Mohd Shaharanee, Izwan Nizal and Mohd Jamil, Jastini (2019) Evaluation of machine learning classifiers in faulty die prediction to maximize cost scrapping avoidance and assembly test capacity savings in semiconductor integrated circuit (IC) manufacturing. AIP Conference Proceedings, 2138. pp. 1-7. ISSN 0094-243X