Mohd Fazil, Azlan Faizal and Mohd Shaharanee, Izwan Nizal and Mohd Jamil, Jastini (2019) Evaluation of machine learning classifiers in faulty die prediction to maximize cost scrapping avoidance and assembly test capacity savings in semiconductor integrated circuit (IC) manufacturing. AIP Conference Proceedings, 2138. pp. 1-7. ISSN 0094-243X

Mohd Fazil, Azlan Faizal and Mohd Shaharanee, Izwan Nizal and Mohd Jamil, Jastini and Ang, Jin Sheng (2020) Framework to reduce cost scrapping and cost of assemble test capacity in semiconductor integrated circuit manufacturing. Technology Reports of Kansai University, 62 (7). pp. 3625-3630. ISSN 04532198